LVEM FOR

Characterization of Nanomaterials

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Electron microscopy is an essential tool for investigations of nanostructured materials. Basic experimental data required by researchers in this field include particle or filament morphology, size distribution, aspect ratio, chemical and phase composition and crystal structure.

A LVEM is the ideal addition to any laboratory doing research with nanostructures. The LVEM TEM mode can be employed to characterize nano-sized particulate or fiber samples and aggregates. It provides an essential part of morphological characterization.

The LVEM5 multimodal imaging capabilities makes it a comprehensive imaging tool. The LVEM5 is truly a 3-in-1 electron microscope. Not only is it a Transmission Electron Microscope (TEM), but it can be configured with up to two different scanning modes for use as a Scanning Election Microscope (SEM) and a Scanning Transmission Electron Microscope (STEM). With the LVEM5 you can switch between imaging modes without moving your sample. This way you can capture both surface and transmission images from the same area of interest. With only one tool you can significantly improve the understanding of various nanoparticles.

The LVEM5 is the most cost-effective multi-modal electron microscope available in a benchtop configuration.

The LVEM25 is built upon the same platform as the LVEM5, but operates at a slightly higher accelerating voltage allowing for an improvement in final image resolution.

Both LVEM microscopes miniature size means that they can be installed in your workspace, right where you need it.

Don't let the small size of the LVEM microscopes mislead you. The LVEM5 is capable of resolving objects as small as 1.2 nanometers in transmission modes, while the LVEM25 can resolve features down to 1.0nm. Additionally, the LVEM systems are capable of producing higher contrast images than conventional transmission electron microscopes without the need for stain.

In no way are you sacrificing imaging quality or obtainable resolution with a benchtop configuration. The LVEM microscopes easily produce high quality images suitable for presentations or publications. They are also so remarkably simple that anyone can use one.

Whether it is for clusters, precipitates, nanowires, nanorods, or quantum dots, particle size can be estimated immediately with a LVEM on a live image. It can then be measured systematically on collected images and the data exported to Excel or statistics package of choice.

LVEM5 User Testimonial

The LVEM5 proved itself as a crucial tool for characterization of nanocrystalline cellulose. It gave us the ability to assess and discriminate structure and morphology of the fibers on various stages of processing, to evaluate and optimize the fiber sources. The TEM imaging with LVEM5 is very fast and provides particularly high contrast on unstained fibers, which we simply could not achieve before with conventional, 100kV TEM equipment.

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Dr. Sabahudin Hrapovic

Technical Officer
Biosensors & Nanobiotechnology - Research Activities
National Research Council Canada

Application Notes
Application Notes

Nanoparticle Size Measurement Techniques

Comparison Of LVEM And Classical TEM For Nanoparticle Sizing

Comparison of Nanoparticle Sizing Techniques: TEM vs. DLS vs. AFM

Use Of Low Voltage Electron Microscopy For Characterization Of Magnetic Nanoparticle Size Distribution

Nano-Science Education

Nanomedicine

LVEM5
NANOSCALE FROM YOUR BENCHTOP

LVEM5 Benchtop Electron Microscope

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LVEM5
FAST | COMPACT | POWERFUL

LVEM25 Electron Microscope

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LVEM25E
ALL IN ONE EM

LVEM 25E Electron Microscope

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