LVEM 5 Benchtop Electron Microscope

The electron source determines in large measure the parameters of the electron microscope. The uniquely-designed Schottky type field emission gun employed by the LVEM 5 has very high brightness and spatial coherency and allows for strong interactions between the emitted electrons and the samples. This is what provides the LVEM 5 with uniquely high contrast.

The LVEM instruments are the only TEMs using permanent magnet lenses. This unique feature allows for the miniature architecture of the microscope and eliminates any cooling requirements. Conventional electron microscopes require active cooling to remove considerable heat generated by electric current circulating in the electromagnetic lenses.

As a result of its small footprint and novel column architecture, the LVEM 5 does not require a dedicated room, anti-vibration isolation, special power supply or cooling of any kind, thereby simplifying the instrument’s installation.

Electron optics
Electron optics provide the initial stages of magnification. The FEG cathode is at the base of the microscope. The electron beam is then shaped by the condenser and objective lenses as electrons travel upwards through the sample. They continue towards the YAG scintillator screen for formation of the initial image. High spatial resolution on the YAG screen enables using high light-optical magnification in a unique two stage magnification system.

TEM BOOST
TEM BOOST is a hardware-based enhancement of the basic TEM imaging mode provides increased total magnification and higher resolving power in the TEM images. A more advanced and powerful projective lens allows for higher magnification and resolution.

Light optics
Light optics that are stable and reliable further magnify the initial image on the YAG screen. There is highly efficient light transport from the luminescent screen into the light optics. A selection of different light objectives allows for a wide range of magnifications.

Image capture is by means of a Scientific CMOS digital camera mounted on the top of the LVEM5. The camera is optimized for low-light, high dynamic range image capture. The magnified image from the light optics is captured for subsequent viewing and analysis.

A backscattered electron detector has been directly incorporated into an electron optics column that was originally designed for transmission electron microscopy alone, enabling scanning electron microscopy to be performed in parallel.

Back-scattered electrons are collected by an annular solid-state detector separately for each scanned point. The spatial intensity distribution of the backscattered electrons is used to form the final image in the software.

The combination of selected spot sizes and optimized working distances allow for a wide range of magnifications. The small working distance creates high spatial resolution and a segmented semi-annular detector provides the choices of material of relief contrast.

With the addition of the STEM photomultiplier, the versatile LVEM 5 has the added capability of scanning transmission microscopy, which can be useful in situations where samples are stained or too thick for conventional TEM imaging.

The LVEM 5 employs a motorized stage with joystick control of X, Y and Z axis for intuitive sample movement. Joystick sensitivity is dynamic, providing quick motion for low magnification sample screening and fine precision for high magnification imaging.

Column: 2 Ion Getter Pumps
Ion pumps are inherently dry, vibration-free and achieve very high vacuum levels. They use no oil as do mechanical rotary-pumps and diffusion pumps. By making use of specially designed Ion Getter Pumps, the LVEM 5 avoids all contamination in the sample space, resulting in stable imaging conditions and absence of artifacts.

Airlock: Turbomolecular Pump with Diaphragm Pump
A maintenance free turbomolecular pump provides rapid evacuation of the airlock system and provides for quick and clean sample exchange. A self-venting system allows for rapid cycle times.

User operations are facilitated via the ergonomic control panel with simple adjustments for illumination, magnification, image optimization and stage position.

The included PC and monitor is delivered complete with pre-installed intuitive software for microscope operations and imaging. The software allows for monitoring and adjustments of all important microscope parameters and makes it possible to switch seamlessly between all imaging modes.

Image acquisition in all modes is carried out directly within the software, providing the capability for on-screen measurements, statistics and FFT. Image corrections such as image brightness and contrast, live-histogram auto-correction and bit-depth selection are also possible.

Images are saved in non-proprietary formats, which can be imported into your favorite image analysis software, such as ImageJ.