Advancing In-Lab Research:
Imaging Nanoparticulates using a Benchtop Low Voltage Electron Microscope

Low Voltage Electron Microscopy (LVEM) is a powerful technique for imaging and characterizing nanoparticulates. Additionally, having an electron microscope directly in the lab accelerates research and streamlines workflows. This webinar will explore the particular benefits of using a benchtop low voltage electron microscope for studying low atomic number materials like carbon nanotubes, PLGA, and DNA origami nanostructures, with a primary focus on TEM techniques. Attendees will learn how benchtop LVEM can enhance image contrast while preserving sample integrity.

The session will be divided into two parts: the first will cover the fundamentals of LVEM, including TEM, SEM, and STEM imaging techniques at 5 kV, as well as sample preparation; followed by a live demonstration of Delong Instruments' LVEM 5 benchtop electron microscope. This webinar will give researchers a comprehensive understanding of how having a benchtop LVEM in their lab can transform their research workflow, providing the opportunity to immediately analyze their samples following preparation.