Electron Diffraction

Technical Overview

Electron diffraction (ED) is most frequently used in the study of crystal structure and solids, and is done by launching electron particles at a desired sample and observing the resulting scatter pattern that the electrons embark on. This is known as wave-particle duality and was applied to microscopy in the early 1940’s when researchers began passing a beam of electrons through thin metal films and crystalline grids to observe the incurring interference patterns. What resulted was the ability to image the crystalline structures of different materials, allowing to view the way matter is structured and stacked together in several materials. This arms the researcher with material information, and from there observations are made on how solid or strong a material really is.

How LVEM does ED

Diffraction mode in both LVEM models is easily accessible from TEM mode and acquired patterns can be attributed to particular areas or features (grains, particles, phases) present in the sample. Subsequent analysis of acquired diffraction patterns can provide information on crystal structure, degree of crystallinity and phase composition of the sample. Polycrystalline areas generate ring diffraction patterns, while single crystals or highly textured thin films produce dot patterns. For more details, please visit the product details pages for the LVEM5 or the LVEM25.

LVEM Sample Prep for ED

Electron Diffraction patterns in LVEM5 can be obtained on thin samples of crystalline or partially crystalline materials (ceramics, metal or polymers). The sample must be electron transparent at the operating voltage of the microscope, free of contamination and damage, and surface topography must be maintained to a minimum. For more details, please visit our page on sample preparation.

Visit our photo gallery for a better look at what scanning electron microscopy within the LVEM5 microscope can do for you.